Discriminant Analysis and Statistical Pattern Recognition

Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions. It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition, all require robust and efficient pattern recognition techniques. This third edition provides an introduction to statistical pattern theory and techniques, with material drawn from a wide range of fields, including the areas of engineering, statistics, computer science and the social sciences. The book has been updated to cover new methods and applications, and includes a wide range of techniques such as Bayesian methods, neural networks, support vector machines, feature selection and feature reduction techniques.Technical descriptions and motivations are provided, and the techniques are illustrated using real examples. Statistical Pattern Recognition, 3rd Edition: Provides a self-contained introduction to statistical pattern recognition. Includes new material presenting the analysis of complex networks. Introduces readers to methods for Bayesian density estimation. Presents descriptions of new applications in biometrics, security, finance and condition monitoring. Provides descriptions and guidance for implementing techniques, which will be invaluable to software engineers and developers seeking to develop real applications Describes mathematically the range of statistical pattern recognition techniques. Presents a variety of exercises including more extensive computer projects. The in-depth technical descriptions make the book suitable for senior undergraduate and graduate students in statistics, computer science and engineering. Statistical Pattern Recognition is also an excellent reference source for technical professionals. Chapters have been arranged to facilitate implementation of the techniques by software engineers and developers in non-statistical engineering fields. www.wiley.com/go/statistical_pattern_recognition

Statistical pattern recognition is a very active area of study and research, which has seen many advances in recent years. New and emerging applications – such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition – require robust and efficient pattern recognition techniques. Statistical decision making and estimation are regarded as fundamental to the study of pattern recognition. Statistical Pattern Recognition, Second Edition has been fully updated with new methods, applications and references. It provides a comprehensive introduction to this vibrant area – with material drawn from engineering, statistics, computer science and the social sciences – and covers many application areas, such as database design, artificial neural networks, and decision support systems. * Provides a self-contained introduction to statistical pattern recognition. * Each technique described is illustrated by real examples. * Covers Bayesian methods, neural networks, support vector machines, and unsupervised classification. * Each section concludes with a description of the applications that have been addressed and with further developments of the theory. * Includes background material on dissimilarity, parameter estimation, data, linear algebra and probability. * Features a variety of exercises, from 'open-book' questions to more lengthy projects. The book is aimed primarily at senior undergraduate and graduate students studying statistical pattern recognition, pattern processing, neural networks, and data mining, in both statistics and engineering departments. It is also an excellent source of reference for technical professionals working in advanced information development environments. For further information on the techniques and applications discussed in this book please visit www.statistical-pattern-recognition.net

A complete introduction to discriminant analysis–extensively revised, expanded, and updated This Second Edition of the classic book, Applied Discriminant Analysis, reflects and references current usage with its new title, Applied MANOVA and Discriminant Analysis. Thoroughly updated and revised, this book continues to be essential for any researcher or student needing to learn to speak, read, and write about discriminant analysis as well as develop a philosophy of empirical research and data analysis. Its thorough introduction to the application of discriminant analysis is unparalleled. Offering the most up-to-date computer applications, references, terms, and real-life research examples, the Second Edition also includes new discussions of MANOVA, descriptive discriminant analysis, and predictive discriminant analysis. Newer SAS macros are included, and graphical software with data sets and programs are provided on the book's related Web site. The book features: Detailed discussions of multivariate analysis of variance and covariance An increased number of chapter exercises along with selected answers Analyses of data obtained via a repeated measures design A new chapter on analyses related to predictive discriminant analysis Basic SPSS(r) and SAS(r) computer syntax and output integrated throughout the book Applied MANOVA and Discriminant Analysis enables the reader to become aware of various types of research questions using MANOVA and discriminant analysis; to learn the meaning of this field's concepts and terms; and to be able to design a study that uses discriminant analysis through topics such as one-factor MANOVA/DDA, assessing and describing MANOVA effects, and deleting and ordering variables.

A timely convergence of two widely used disciplines Random Graphs for Statistical Pattern Recognition is the first book to address the topic of random graphs as it applies to statistical pattern recognition. Both topics are of vital interest to researchers in various mathematical and statistical fields and have never before been treated together in one book. The use of data random graphs in pattern recognition in clustering and classification is discussed, and the applications for both disciplines are enhanced with new tools for the statistical pattern recognition community. New and interesting applications for random graph users are also introduced. This important addition to statistical literature features: Information that previously has been available only through scattered journal articles Practical tools and techniques for a wide range of real-world applications New perspectives on the relationship between pattern recognition and computational geometry Numerous experimental problems to encourage practical applications With its comprehensive coverage of two timely fields, enhanced with many references and real-world examples, Random Graphs for Statistical Pattern Recognition is a valuable resource for industry professionals and students alike.

An accessible and up-to-date treatment featuring the connection between neural networks and statistics A Statistical Approach to Neural Networks for Pattern Recognition presents a statistical treatment of the Multilayer Perceptron (MLP), which is the most widely used of the neural network models. This book aims to answer questions that arise when statisticians are first confronted with this type of model, such as: How robust is the model to outliers? Could the model be made more robust? Which points will have a high leverage? What are good starting values for the fitting algorithm? Thorough answers to these questions and many more are included, as well as worked examples and selected problems for the reader. Discussions on the use of MLP models with spatial and spectral data are also included. Further treatment of highly important principal aspects of the MLP are provided, such as the robustness of the model in the event of outlying or atypical data; the influence and sensitivity curves of the MLP; why the MLP is a fairly robust model; and modifications to make the MLP more robust. The author also provides clarification of several misconceptions that are prevalent in existing neural network literature. Throughout the book, the MLP model is extended in several directions to show that a statistical modeling approach can make valuable contributions, and further exploration for fitting MLP models is made possible via the R and S-PLUS® codes that are available on the book's related Web site. A Statistical Approach to Neural Networks for Pattern Recognition successfully connects logistic regression and linear discriminant analysis, thus making it a critical reference and self-study guide for students and professionals alike in the fields of mathematics, statistics, computer science, and electrical engineering.

A new approach to the issue of data quality in pattern recognition Detailing foundational concepts before introducing more complex methodologies and algorithms, this book is a self-contained manual for advanced data analysis and data mining. Top-down organization presents detailed applications only after methodological issues have been mastered, and step-by-step instructions help ensure successful implementation of new processes. By positioning data quality as a factor to be dealt with rather than overcome, the framework provided serves as a valuable, versatile tool in the analysis arsenal. For decades, practical need has inspired intense theoretical and applied research into pattern recognition for numerous and diverse applications. Throughout, the limiting factor and perpetual problem has been data—its sheer diversity, abundance, and variable quality presents the central challenge to pattern recognition innovation. Pattern Recognition: A Quality of Data Perspective repositions that challenge from a hurdle to a given, and presents a new framework for comprehensive data analysis that is designed specifically to accommodate problem data. Designed as both a practical manual and a discussion about the most useful elements of pattern recognition innovation, this book: Details fundamental pattern recognition concepts, including feature space construction, classifiers, rejection, and evaluation Provides a systematic examination of the concepts, design methodology, and algorithms involved in pattern recognition Includes numerous experiments, detailed schemes, and more advanced problems that reinforce complex concepts Acts as a self-contained primer toward advanced solutions, with detailed background and step-by-step processes Introduces the concept of granules and provides a framework for granular computing Pattern recognition plays a pivotal role in data analysis and data mining, fields which are themselves being applied in an expanding sphere of utility. By facing the data quality issue head-on, this book provides students, practitioners, and researchers with a clear way forward amidst the ever-expanding data supply.

3D Face Modeling, Analysis and Recognition presents methodologies for analyzing shapes of facial surfaces, develops computational tools for analyzing 3D face data, and illustrates them using state-of-the-art applications. The methodologies chosen are based on efficient representations, metrics, comparisons, and classifications of features that are especially relevant in the context of 3D measurements of human faces. These frameworks have a long-term utility in face analysis, taking into account the anticipated improvements in data collection, data storage, processing speeds, and application scenarios expected as the discipline develops further. The book covers face acquisition through 3D scanners and 3D face pre-processing, before examining the three main approaches for 3D facial surface analysis and recognition: facial curves; facial surface features; and 3D morphable models. Whilst the focus of these chapters is fundamentals and methodologies, the algorithms provided are tested on facial biometric data, thereby continually showing how the methods can be applied. Key features: • Explores the underlying mathematics and will apply these mathematical techniques to 3D face analysis and recognition • Provides coverage of a wide range of applications including biometrics, forensic applications, facial expression analysis, and model fitting to 2D images • Contains numerous exercises and algorithms throughout the book

Statistical Factor Analysis and Related Methods Theory and Applications In bridging the gap between the mathematical and statistical theory of factor analysis, this new work represents the first unified treatment of the theory and practice of factor analysis and latent variable models. It focuses on such areas as: * The classical principal components model and sample-population inference * Several extensions and modifications of principal components, including Q and three-mode analysis and principal components in the complex domain * Maximum likelihood and weighted factor models, factor identification, factor rotation, and the estimation of factor scores * The use of factor models in conjunction with various types of data including time series, spatial data, rank orders, and nominal variable * Applications of factor models to the estimation of functional forms and to least squares of regression estimators

A comprehensive guide to the essential principles of image processing and pattern recognition Techniques and applications in the areas of image processing and pattern recognition are growing at an unprecedented rate. Containing the latest state-of-the-art developments in the field, Image Processing and Pattern Recognition presents clear explanations of the fundamentals as well as the most recent applications. It explains the essential principles so readers will not only be able to easily implement the algorithms and techniques, but also lead themselves to discover new problems and applications. Unlike other books on the subject, this volume presents numerous fundamental and advanced image processing algorithms and pattern recognition techniques to illustrate the framework. Scores of graphs and examples, technical assistance, and practical tools illustrate the basic principles and help simplify the problems, allowing students as well as professionals to easily grasp even complicated theories. It also features unique coverage of the most interesting developments and updated techniques, such as image watermarking, digital steganography, document processing and classification, solar image processing and event classification, 3-D Euclidean distance transformation, shortest path planning, soft morphology, recursive morphology, regulated morphology, and sweep morphology. Additional topics include enhancement and segmentation techniques, active learning, feature extraction, neural networks, and fuzzy logic. Featuring supplemental materials for instructors and students, Image Processing and Pattern Recognition is designed for undergraduate seniors and graduate students, engineering and scientific researchers, and professionals who work in signal processing, image processing, pattern recognition, information security, document processing, multimedia systems, and solar physics.

A comprehensive guide to the essential principles of image processing and pattern recognition Techniques and applications in the areas of image processing and pattern recognition are growing at an unprecedented rate. Containing the latest state-of-the-art developments in the field, Image Processing and Pattern Recognition presents clear explanations of the fundamentals as well as the most recent applications. It explains the essential principles so readers will not only be able to easily implement the algorithms and techniques, but also lead themselves to discover new problems and applications. Unlike other books on the subject, this volume presents numerous fundamental and advanced image processing algorithms and pattern recognition techniques to illustrate the framework. Scores of graphs and examples, technical assistance, and practical tools illustrate the basic principles and help simplify the problems, allowing students as well as professionals to easily grasp even complicated theories. It also features unique coverage of the most interesting developments and updated techniques, such as image watermarking, digital steganography, document processing and classification, solar image processing and event classification, 3-D Euclidean distance transformation, shortest path planning, soft morphology, recursive morphology, regulated morphology, and sweep morphology. Additional topics include enhancement and segmentation techniques, active learning, feature extraction, neural networks, and fuzzy logic. Featuring supplemental materials for instructors and students, Image Processing and Pattern Recognition is designed for undergraduate seniors and graduate students, engineering and scientific researchers, and professionals who work in signal processing, image processing, pattern recognition, information security, document processing, multimedia systems, and solar physics.