Spacecraft Reliability and Multi-State Failures. A Statistical Approach

Statistical Models and Methods for Reliability and Survival Analysis brings together contributions by specialists in statistical theory as they discuss their applications providing up-to-date developments in methods used in survival analysis, statistical goodness of fit, stochastic processes for system reliability, amongst others. Many of these are related to the work of Professor M. Nikulin in statistics over the past 30 years. The authors gather together various contributions with a broad array of techniques and results, divided into three parts – Statistical Models and Methods, Statistical Models and Methods in Survival Analysis, and Reliability and Maintenance. The book is intended for researchers interested in statistical methodology and models useful in survival analysis, system reliability and statistical testing for censored and non-censored data.

Amstat News asked three review editors to rate their top five favorite books in the September 2003 issue. Statistical Methods for Reliability Data was among those chosen. Bringing statistical methods for reliability testing in line with the computer age This volume presents state-of-the-art, computer-based statistical methods for reliability data analysis and test planning for industrial products. Statistical Methods for Reliability Data updates and improves established techniques as it demonstrates how to apply the new graphical, numerical, or simulation-based methods to a broad range of models encountered in reliability data analysis. It includes methods for planning reliability studies and analyzing degradation data, simulation methods used to complement large-sample asymptotic theory, general likelihood-based methods of handling arbitrarily censored data and truncated data, and more. In this book, engineers and statisticians in industry and academia will find: A wealth of information and procedures developed to give products a competitive edge Simple examples of data analysis computed with the S-PLUS system-for which a suite of functions and commands is available over the Internet End-of-chapter, real-data exercise sets Hundreds of computer graphics illustrating data, results of analyses, and technical concepts An essential resource for practitioners involved in product reliability and design decisions, Statistical Methods for Reliability Data is also an excellent textbook for on-the-job training courses, and for university courses on applied reliability data analysis at the graduate level. An Instructor's Manual presenting detailed solutions to all the problems in the book is available upon requestfrom the Wiley editorial department.

This is the second edition of the successful textbook written by the prize-winning scientist Andreas Ziegler, former President of the German Chapter of the International Biometric Society, and Inke Konig, who has been teaching the subject over many years. The book gives a comprehensive introduction into the relevant statistical methods in genetic epidemiology. The second edition is thoroughly revised, partly rewritten and includes now chapters on segregation analysis, twin studies and estimation of heritability. The book is ideally suited for advanced students in epidemiology, genetics, statistics, bioinformatics and biomathematics. Like in the first edition the book contains many problems and solutions and it comes now optionally with an e-learning course created by Friedrich Pahlke. This e-learning course has been developed to complement the book. Both provide a unique support tool for teaching the subject.

This textbook brings together the fundamentals of the macroscopic and microscopic aspects of thermal physics by presenting thermodynamics and statistical mechanics as complementary theories based on small numbers of postulates. The book is designed to give the instructor flexibility in structuring courses for advanced undergraduates and/or beginning graduate students and is written on the principle that a good text should also be a good reference. The presentation of thermodynamics follows the logic of Clausius and Kelvin while relating the concepts involved to familiar phenomena and the modern student's knowledge of the atomic nature of matter. Another unique aspect of the book is the treatment of the mathematics involved. The essential mathematical concepts are briefly reviewed before using them, and the similarity of the mathematics to that employed in other fields of physics is emphasized. The text gives in depth treatments of low density gases, harmonic solids, magnetic and dielectric materials, phase transitions, and the concept of entropy. The microcanonical, canonical, and grand canonical ensembles of statistical mechanics are derived and used as the starting point for the analysis of fluctuations, blackbody radiation, the Maxwell distribution, Fermi-Dirac statistics, Bose-Einstein condensation, and the statistical basis of computer simulations. Supplementary material including PowerPoint slides and detailed worked solutions can be downloaded online at http://booksupport.wiley.com

Earthquake occurrence modeling is a rapidly developing research area. This book deals with its critical issues, ranging from theoretical advances to practical applications. The introductory chapter outlines state-of-the-art earthquake modeling approaches based on stochastic models. Chapter 2 presents seismogenesis in association with the evolving stress field. Chapters 3 to 5 present earthquake occurrence modeling by means of hidden (semi-)Markov models and discuss associated characteristic measures and relative estimation aspects. Further comparisons, the most important results and our concluding remarks are provided in Chapters 6 and 7.

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews “Semiconductor L

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews “Semiconductor L

Wall turbulence is encountered in many technological applications as well as in the atmosphere, and a detailed understanding leading to its management would have considerable beneficial consequences in many areas. A lot of inspired work by experimenters, theoreticians, engineers and mathematicians has been accomplished over recent decades on this important topic and Statistical Approach to Wall Turbulence provides an updated and integrated view on the progress made in this area. Wall turbulence is a complex phenomenon that has several industrial applications, such as in aerodynamics, turbomachinery, geophysical flows, internal engines, etc. Several books exist on fluid turbulence, but Statistical Approach to Wall Turbulence is original in the sense that it focuses solely on the turbulent flows bounded by solid boundaries. The book covers the different physical aspects of wall turbulence, beginning with classical phenomenological aspects before advancing to recent research in the effects of the Reynolds numbers, near wall coherent structures, and wall turbulent transport process. This book would be of interest to postgraduate and undergraduate students in mechanical, chemical, and aerospace engineering, as well as researchers in aerodynamics, combustion, and all applications of wall turbulence.

This undergraduate textbook provides a statistical mechanical foundation to the classical laws of thermodynamics via a comprehensive treatment of the basics of classical thermodynamics, equilibrium statistical mechanics, irreversible thermodynamics, and the statistical mechanics of non-equilibrium phenomena. This timely book has a unique focus on the concept of entropy, which is studied starting from the well-known ideal gas law, employing various thermodynamic processes, example systems and interpretations to expose its role in the second law of thermodynamics. This modern treatment of statistical physics includes studies of neutron stars, superconductivity and the recently developed fluctuation theorems. It also presents figures and problems in a clear and concise way, aiding the student’s understanding.

An accessible and up-to-date treatment featuring the connection between neural networks and statistics A Statistical Approach to Neural Networks for Pattern Recognition presents a statistical treatment of the Multilayer Perceptron (MLP), which is the most widely used of the neural network models. This book aims to answer questions that arise when statisticians are first confronted with this type of model, such as: How robust is the model to outliers? Could the model be made more robust? Which points will have a high leverage? What are good starting values for the fitting algorithm? Thorough answers to these questions and many more are included, as well as worked examples and selected problems for the reader. Discussions on the use of MLP models with spatial and spectral data are also included. Further treatment of highly important principal aspects of the MLP are provided, such as the robustness of the model in the event of outlying or atypical data; the influence and sensitivity curves of the MLP; why the MLP is a fairly robust model; and modifications to make the MLP more robust. The author also provides clarification of several misconceptions that are prevalent in existing neural network literature. Throughout the book, the MLP model is extended in several directions to show that a statistical modeling approach can make valuable contributions, and further exploration for fitting MLP models is made possible via the R and S-PLUS® codes that are available on the book's related Web site. A Statistical Approach to Neural Networks for Pattern Recognition successfully connects logistic regression and linear discriminant analysis, thus making it a critical reference and self-study guide for students and professionals alike in the fields of mathematics, statistics, computer science, and electrical engineering.