X-Ray Diffraction by Polycrystalline Materials

Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to researchers in materials science, chemistry, physics, and pharmaceuticals, as well as graduate-level students in these areas.

An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis Two-Dimensional X-Ray Diffraction, Second Edition is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.

Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

A clear-cut introduction to the technique and applications of x-ray absorption spectroscopy X-ray Absorption Spectroscopy is being applied to a widening set of disciplines. Applications started with solid state physics and grew to materials science, chemistry, biochemistry and geology. Now, they cut across engineering materials, environmental science and national heritage – providing very detailed and useful information facilitating understanding and development of materials. This practical guide helps investigators choose the right experiment, carry it out properly and analyze the data to give the best reliable result. It gives readers insights to extract what they need from the world of large-scale experimental facilities like synchrotrons, which seem distant to many laboratory scientists. X-ray Absorption Spectroscopy for the Chemical and Materials Sciences seeks to educate readers about the strengths and limitations of the techniques, including their accessibility. Presented in six sections, it offers chapters that cover: an introduction to X-ray absorption fine structure XAFS; the basis of XAFS; X-ray sources; experimental methods; data analysis and simulation methods; and case studies. A no-nonsense introduction to the technique and applications of x-ray absorption spectroscopy Features Questions to support learning through the book Relevant to all working on synchrotron sources and applications in physics, materials, environment/geology and biomedical materials Four-color representation allows easy interpretation of images and data for the reader X-ray Absorption Spectroscopy for the Chemical and Materials Sciences is aimed at Masters-level and PhD students embarking on X-ray spectroscopy projects as well as scientists in areas of materials characterization.

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

The book has a dual purpose. The first is to expose a general methodology to solve problems of electromagnetism in geometries constituted of angular regions. The second is to bring the solutions of some canonical problems of fundamental importance in modern electromagnetic engineering with the use of the Wiener-Hopf technique.
In particular, the general mathematical methodology is very ingenious and original. It is based on sophisticated and attractive procedures exploiting simple and advanced properties of analytical functions. Once the reader has acquired the methodology, they can easily obtain the solution of the canonical problems reported in the book. The book can be appealing also to readers who are not directly interested in the detailed mathematical methodology and/ or in electromagnetics. In fact the same methodology can be extended to acoustics and elasticity problems. Moreover, the proposed practical problems with their solutions constitute a list of reference solutions and can be of interest in engineering production in the field of radio propagations, electromagnetic compatibility and radar technologies.

The book has a dual purpose. The first is to expose a general methodology to solve problems of electromagnetism in geometries constituted of angular regions. The second is to bring the solutions of some canonical problems of fundamental importance in modern electromagnetic engineering with the use of the Wiener-Hopf technique. In particular, the general mathematical methodology is very ingenious and original. It is based on sophisticated and attractive procedures exploiting simple and advanced properties of analytical functions. Once the reader has acquired the methodology, she/he can easily obtain the solution of the canonical problems reported in the book. The book can be appealing also to readers who are not directly interested in the detailed mathematical methodology and/ or in electromagnetics. In fact the same methodology can be extended to acoustics and elasticity problems. Moreover, the proposed practical problems with their solutions constitute a list of reference solutions and can be of interests in engineering production in the field of radio propagations, electromagnetic compatibility and radar technologies.

The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).

This book presents reviews of various aspects of radiation/matter interactions, be these instrumental developments, the application of the study of the interaction of X-rays and materials to a particular scientific field, or specific methodological approaches. The overall aim of the book is to provide reference summaries for a range of specific subject areas within a pedagogical framework. Each chapter is written by an author who is well known within their field and who has delivered an invited lecture on their subject area as part of the “RX2009 – X-rays and Materials” colloquium that took place in December 2009 at Orsay in France. The book consists of five chapters on the subject of X-ray diffraction, scattering and absorption. Chapter 1 gives a detailed presentation of the capabilities and potential of beam lines dedicated to condensed matter studies at the SOLEIL synchrotron radiation source. Chapter 2 focuses on the study of nanoparticles using small-angle X-ray scattering. Chapter 3 discusses the quantitative studies of this scattering signal used to analyze these characteristics in detail. Chapter 4 discusses relaxor materials, which are ceramics with a particularly complex microstructure. Chapter 5 discusses an approach enabling the in situ analysis of these phase transitions and their associated microstructural changes.