Толстовка Electron 3.0 Толстовка Electron 3.0 Grey/Red

Written by one of the top scientists in this field, this is a systematic overview of the fundamental concepts and powerful applications.
The author presents the central theories and mechanisms in electron transfer, followed by several systems in nature where this is important, while also covering modern green applications.
An invaluable resource for graduate students and researchers working in this field in academia and industry.

Diagnostic Electron Microscopy: A Practical Guide to Interpretation and Technique summarises the current interpretational applications of TEM in diagnostic pathology. This concise and accessible volume provides a working guide to the main, or most useful, applications of the technique including practical topics of concern to laboratory scientists, brief guides to traditional tissue and microbiological preparation techniques, microwave processing, digital imaging and measurement uncertainty. The text features both a screening and interpretational guide for TEM diagnostic applications and current TEM diagnostic tissue preparation methods pertinent to all clinical electron microscope units worldwide. Containing high-quality representative images, this up-to-date text includes detailed information on the most important diagnostic applications of transmission electron microscopy as well as instructions for specific tissues and current basic preparative techniques. The book is relevant to trainee pathologists and practising pathologists who are expected to understand and evaluate/screen tissues by TEM. In addition, technical and scientific staff involved in tissue preparation and diagnostic tissue evaluation/screening by TEM will find this text useful.

Easy-to-follow guide helps you take full advantage of EPR spectroscopy's capabilities Electron Paramagnetic Resonance: A Practitioner's Toolkit serves as a practical guide that enables you to navigate through and make sense of the complex maze of electron paramagnetic resonance (EPR) spectroscopy fundamentals, techniques, and applications. The first half of this book is dedicated to explaining the core principles of EPR spectroscopy, using clear, easy-to-follow explanations and examples while avoiding complex physics and mathematics. The second half of the book focuses on applications, including problem-solving strategies for such fields as biology, medicine, material science, chemistry, physics, and radiation effects on matter. Carefully edited by two experienced EPR scientists, this book features a team of eighteen expert authors. Their contributions are based not only on a thorough examination and analysis of the primary literature, but also on their own firsthand experience in research and applications. As a result, the book is filled with practical advice, tips, and cautions addressing such issues as: Choosing the right experiment Selecting experimental parameters and sample size Avoiding setbacks and pitfalls Simulating the spectra With its straightforward explanations and clear examples, this book is just what researchers need to take full advantage of EPR spectroscopy's tremendous capabilities. It is particularly recommended for those interested in applications to chemistry, biology, medicine, and material science.

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.

This handbook is aimed to deliver an up-to-date account of some of the recently developed experimental and theoretical methods in EPR, as well as a complete up-to-date listing of the experimentally determined values of multifrequency transition-ion spin Hamiltonian parameters by Sushil Misra, reported in the past 20 years, extending such a listing published by him in the Handbook on Electron Spin Resonance, volume 2. This extensive data tabulation makes up roughly 60% of the book`s content. It is complemented by the first full compilation of hyperfine splittings and g-factors for aminoxyl (nitroxide) radicals since 197 by Larry Berliner, a world expert on spin labeling, helping to identify and interpret substances and processes by means of EPR techniques. The book also includes coverage of the recently developed experimental technique of rapid-scan EPR by Sandra Eaton and Gareth Eaton, and a thorough review of computational modeling in EPR by Stefan Stoll, author of Easy Spin.

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

The Novartis Foundation Series is a popular collection of the proceedings from Novartis Foundation Symposia, in which groups of leading scientists from a range of topics across biology, chemistry and medicine assembled to present papers and discuss results. The Novartis Foundation, originally known as the Ciba Foundation, is well known to scientists and clinicians around the world.

Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large numbers not only in academia, but also in industrial research centers and fabs. This book presents in a simple and practical way the new quantitative techniques based on TEM which have recently been invented or developed to address most of the main challenging issues scientists and process engineers have to face to develop or optimize semiconductor layers and devices. Several of these techniques are based on electron holography; others take advantage of the possibility of focusing intense beams within nanoprobes. Strain measurements and mappings, dopant activation and segregation, interfacial reactions at the nanoscale, defect identification and specimen preparation by FIB are among the topics presented in this book. After a brief presentation of the underlying theory, each technique is illustrated through examples from the lab or fab.

A practical, in-depth description of the physics behind electron emission physics and its usage in science and technology Electron emission is both a fundamental phenomenon and an enabling component that lies at the very heart of modern science and technology. Written by a recognized authority in the field, with expertise in both electron emission physics and electron beam physics, An Introduction to Electron Emission provides an in-depth look at the physics behind thermal, field, photo, and secondary electron emission mechanisms, how that physics affects the beams that result through space charge and emittance growth, and explores the physics behind their utilization in an array of applications. The book addresses mathematical and numerical methods underlying electron emission, describing where the equations originated, how they are related, and how they may be correctly used to model actual sources for devices using electron beams. Writing for the beam physics and solid state communities, the author explores applications of electron emission methodology to solid state, statistical, and quantum mechanical ideas and concepts related to simulations of electron beams to condensed matter, solid state and fabrication communities. Provides an extensive description of the physics behind four electron emission mechanisms—field, photo, and secondary, and how that physics relates to factors such as space charge and emittance that affect electron beams. Introduces readers to mathematical and numerical methods, their origins, and how they may be correctly used to model actual sources for devices using electron beams Demonstrates applications of electron methodology as well as quantum mechanical concepts related to simulations of electron beams to solid state design and manufacture Designed to function as both a graduate-level text and a reference for research professionals Introduction to the Physics of Electron Emission is a valuable learning tool for postgraduates studying quantum mechanics, statistical mechanics, solid state physics, electron transport, and beam physics. It is also an indispensable resource for academic researchers and professionals who use electron sources, model electron emission, develop cathode technologies, or utilize electron beams.