Fringe Pattern Analysis for Optical Metrology

New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. * New introductory sections to all chapters. * Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. * Thorough coverage of the CCD camera.

A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of a layer in a layer stack by measuring the spectral reflectance or transmittance, is treated in the following three chapters. The color of thin layers is discussed in chapter 6. Finally, in chapter 7, the author discusses several industrial applications of the layer thickness measurement, including high-reflection and anti-reflection coatings, photolithographic structuring of semiconductors, silicon on insulator, transparent conductive films, oxides and polymers, thin film photovoltaics, and heavily doped silicon. Aimed at industrial and academic researchers, engineers, developers and manufacturers involved in all areas of optical layer and thin optical film measurement and metrology, process control, real-time monitoring, and applications.

A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.

An up-to-date, comprehensive guide for advanced electrical engineering studentsand electrical engineers working in the IC and optical industries This book covers the major transimpedance amplifier (TIA) topologies and their circuit implementations for optical receivers. This includes the shunt-feedback TIA, common-base TIA, common-gate TIA, regulated-cascode TIA, distributed-amplifier TIA, nonresistive feedback TIA, current-mode TIA, burst-mode TIA, and analog-receiver TIA. The noise, transimpedance, and other performance parameters of these circuits are analyzed and optimized. Topics of interest include post amplifiers, differential vs. single-ended TIAs, DC input current control, and adaptive transimpedance. The book features real-world examples of TIA circuits for a variety of receivers (direct detection, coherent, burst-mode, etc.) implemented in a broad array of technologies (HBT, BiCMOS, CMOS, etc.). The book begins with an introduction to optical communication systems, signals, and standards. It then moves on to discussions of optical fiber and photodetectors. This discussion includes p-i-n photodetectors; avalanche photodetectors (APD); optically preamplified detectors; integrated detectors, including detectors for silicon photonics; and detectors for phase-modulated signals, including coherent detectors. This is followed by coverage of the optical receiver at the system level: the relationship between noise, sensitivity, optical signal-to-noise ratio (OSNR), and bit-error rate (BER) is explained; receiver impairments, such as intersymbol interference (ISI), are covered. In addition, the author presents TIA specifications and illustrates them with example values from recent product data sheets. The book also includes: Many numerical examples throughout that help make the material more concrete for readers Real-world product examples that show the performance of actual IC designs Chapter summaries that highlight the key points Problems and their solutions for readers who want to practice and deepen their understanding of the material Appendices that cover communication signals, eye diagrams, timing jitter, nonlinearity, adaptive equalizers, decision point control, forward error correction (FEC), and second-order low-pass transfer functions Analysis and Design of Transimpedance Amplifiers for Optical Receivers belongs on the reference shelves of every electrical engineer working in the IC and optical industries. It also can serve as a textbook for upper-level undergraduates and graduate students studying integrated circuit design and optical communication.

A complete survey of modern design and analysis techniques for optical waveguides This volume thoroughly details modern and widely accepted methods for designing the optical waveguides used in telecommunications systems. It offers a straightforward presentation of the sophisticated techniques used in waveguide analysis and enables a quick grasp of modern numerical methods with easy mathematics. The book is intended to guide the reader to a comprehensive understanding of optical waveguide analysis through self-study. This comprehensive presentation includes: * An extensive and exhaustive list of mathematical manipulations * Detailed explanations of common design methods: finite element method (FEM), finite difference method (FDM), beam propagation method (BPM), and finite difference time-domain method (FD-TDM) * Explanations for numerical solutions of optical waveguide problems with sophisticated techniques used in modern computer-aided design (CAD) software * Solutions to Maxwell's equations and the Schrodinger equation The authors provide excellent self-study material for practitioners, researchers, and students, while also presenting detailed mathematical manipulations that can be easily understood by readers who are unfamiliar with them. Introduction to Optical Waveguide Analysis presents modern design methods in a comprehensive and easy-to-understand format.

For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.

Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes. Addresses particle characterization where digital holography has proven capability for dynamic measurement of particles in 3D for sizing and shape characterization, with applications in microfluidics as well as crystallization and aerosol detection studies. Discusses digital reflection holography, digital transmission holography, digital in-line holography, and digital holographic tomography and applications. Covers other applications including micro-optical and diffractive optical systems and the testing of these components, and bio-imaging.

This book focuses heavily on the principles, analysis and applications of code-division multiple-access (CDMA) techniques in optical communication systems and networks. In this book, the authors intimately discuss modern optical networks and their applications in current and emerging communication technologies, evaluating the quality, speed and number of supported services. In particular, principles and fundamentals of optical CDMA techniques from beginner to advanced levels are heavily covered. Furthermore, the authors concentrate on methods and techniques of various encoding and decoding schemes and their structures, as well as analysis of optical CDMA systems with various transceiver models including advanced multi-level incoherent and coherent modulations with the architecture of access/aggregation networks in mind. Moreover, authors examine intriguing topics of optical CDMA networking, compatibility with IP networks, and implementation of optical multi-rate multi-service CDMA networks. Key features: Expanded coverage of optical CDMA networks, starts from principles and fundamentals Comprehensive mathematical modelling and analysis from signal to system levels Addresses the applications of modern optical networking in the current and emerging communication technologies Greater focus on advanced optical multi-level incoherent and coherent modulations, spreading codes, and transceiver designs Detailed hardware specifications, system-level block diagrams, and network nodes’ functionalities This book appeals to researchers, practicing engineers, and advanced students. It is a practical resource for readers with an interest in optical communications and networks.

The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. «For both applied and theoretical statisticians as well as investigators working in the many areas in which relevant use can be made of discriminant techniques, this monograph provides a modern, comprehensive, and systematic account of discriminant analysis, with the focus on the more recent advances in the field.» –SciTech Book News «. . . a very useful source of information for any researcher working in discriminant analysis and pattern recognition.» –Computational Statistics Discriminant Analysis and Statistical Pattern Recognition provides a systematic account of the subject. While the focus is on practical considerations, both theoretical and practical issues are explored. Among the advances covered are regularized discriminant analysis and bootstrap-based assessment of the performance of a sample-based discriminant rule, and extensions of discriminant analysis motivated by problems in statistical image analysis. The accompanying bibliography contains over 1,200 references.

The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.